The use of through focus exit wave reconstruction in the structure determination of several intermetallic superconductors

Ultramicroscopy

Volumn 64, Issue 1-4, 1996, Pages 231-247

  Zandbergen, H W ^a   Tang, D ^a   Jansen, J ^a,b   Cava, R J ^c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

^c LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; IMAGE RECONSTRUCTION; INTERMETALLICS; SUPERCONDUCTING MATERIALS;

ATOM POSITIONS; WAVE RECONSTRUCTION;

ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; IMAGE RECONSTRUCTION;

EID: 0030221894     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00015-0     Document Type: Article

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