Measurement of dislocation core distribution by digital processing of high-resolution transmission electron microscopy micrographs: A new technique for studying defects

Journal of Physics Condensed Matter

Volumn 12, Issue 49, 2000, Pages 10313-10318

  Kret, Sławomir ^a   Dłuzewski, Paweł ^b   Dłuzewski, Piotr ^a   Sobczak, Ewa ^a  

^a INSTITUTE OF PHYSICS   (Poland)

^b INSTITUTE OF FUNDAMENTAL TECHNOLOGICAL RESEARCH   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DIGITAL SIGNAL PROCESSING; HETEROJUNCTIONS; TOPOLOGY; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

DISLOCATION CORE DISTRIBUTION (DCD);

DISLOCATIONS (CRYSTALS);

EID: 0342972879     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/49/334     Document Type: Article

References (8)

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