Reliability of atom column positions in a ternary system determined by quantitative high-resolution transmission electron microscopy

Journal of Microscopy

Volumn 190, Issue 1-2, 1998, Pages 144-158

  Kienzle, O ^a   Ernst, F ^a   Mobus G ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Digital image processing; Grain boundaries; Quantitative HRTEM; Reliability of atom columns; Strontium titanate (SrTiO3); Twin boundary

Indexed keywords

ATOMS; CRYSTAL ATOMIC STRUCTURE; GRAIN BOUNDARIES; ITERATIVE METHODS; RANDOM ERRORS; RELIABILITY; STRONTIUM TITANATES;

ATOMISTIC STRUCTURE; GRAIN-BOUNDARIES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ITERATIVE STRUCTURES; QUANTITATIVE HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; RELIABILITY OF ATOM COLUMN; STRONTIUM TITANATE (SRTIO3); STRUCTURE REFINEMENTS; TRANSMISSION ELECTRON MICROSCOPY IMAGES; TWIN BOUNDARIES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

STRONTIUM TITANATE; UNCLASSIFIED DRUG;

ARTICLE; CRYSTAL STRUCTURE; DIGITAL FILTERING; IMAGE PROCESSING; INFORMATION RETRIEVAL; PRIORITY JOURNAL; QUANTITATIVE DIAGNOSIS; RELIABILITY; STATISTICAL ANALYSIS; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031897297     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.3090862.x     Document Type: Article

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