Atomic-scale mapping of local lattice distortions in highly strained coherent islands of InxGa1-xAs/GaAs byhigh-resolution electron microscopy and image processing

Philosophical Magazine Letters

Volumn 77, Issue 5, 1998, Pages 249-256

  Kret, S ^a   Delamarre, C ^a   Laval, J Y ^a   Dubon, A ^a  

^a PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE PROCESSING; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR GROWTH;

BIAXIAL COMPRESSION; COHERENT ISLANDS;

HETEROJUNCTIONS;

EID: 0032064350     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008398178381     Document Type: Article

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