Influence of imaging parameters and specimen thinning on strain measurements in Au/Ni MBE multilayers by HREM image processing

Microscopy Microanalysis Microstructures

Volumn 8, Issue 2, 1997, Pages 125-135

  Bayle Guillemaud, Pascale ^a   Thibault, Jany ^a,b  

^a CEA GRENOBLE   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000999764     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997111     Document Type: Article

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