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Applied Physics A: Materials Science and Processing

Volumn 62, Issue 4, 1996, Pages 369-372

Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images

(2) Stenkamp, D a Strunk, H P a

a UNIVERSITY OF ERLANGEN NUREMBERG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CORRELATION METHODS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; FOURIER TRANSFORMS; GEOMETRY; INTERFACES (MATERIALS);

COMPUTER AIDED IMAGE MATCHING TECHNIQUES; DEFOCUS; FOURIER COEFFICIENTS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030129271 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/BF01594235 Document Type: Article

Times cited : (22)

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