Examination of the LeafScan 45, a line-illuminating micro-densitometer, for its use in electron crystallography

Ultramicroscopy

Volumn 68, Issue 2, 1997, Pages 109-121

  Mitsuoka, Kaoru ^a   Murata, Kazuyoshi ^a   Kimura, Yoshiaki ^b   Namba, Keiichi ^a   Fujiyoshi, Yoshinori ^a,c  

^a ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL   (Japan)

^b BIOMOL ENG RESEARCH INSTITUTE   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

Electron crystallography; Electron microscopy; Image detectors

Indexed keywords

CRYSTALLOGRAPHY; ELECTRON MICROSCOPY; IMAGE PROCESSING;

ELECTRON CRYSTALLOGRAPHY; IMAGE DETECTORS; MICRODENSITOMETERS;

DENSITOMETERS;

ARTICLE; CRYSTALLOGRAPHY; DIGITAL FILTERING; ELECTRON MICROSCOPY; IMAGE QUALITY; MICRODENSITOMETRY;

EID: 0031570708     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00020-X     Document Type: Article

References (14)

1. [1] L.A. Amos, R. Henderson, P.N.T. Unwin, Prog. Biophys. Molec. Biol. 39 (1982) 183.
2. [2] R. Henderson, J.M. Baldwin, K.H. Downing, J. Lepault, F. Zemlin, Ultramicroscopy 19 (1986) 147.
3. [3] A. Olofsson, U. Kaveus, H. Hebert, J. Electron Microscopy Technique 8 (1988) 381.
4. [4] C.M. Anderson, M.H. Slovak, Publications Astron. Soc. Pacific 95 (1983) 792.
5. [5] W. Döler, S. Rassow, A. Jäger, R. Vosshenrich, Phys. Med. Biol. 39 (1994) 917.
6. [6] R. Henderson, R.M. Glaeser, Ultramicroscopy 16 (1985) 139.
7. [7] F. Seiff, I. Wallat, P. Ermann, M. Heyn, Proc. Natl. Acad. Sci. USA 82 (1985) 3227.
8. [8] J. Baldwin, R. Henderson, Ultramicroscopy 14 (1984) 319.
9. [9] T. Hirai et al., Ultramicroscopy, in preparation.
10. [10] Y. Fujiyoshi,T. Mizusaki, K. Morikawa, M. Yamagishi, Y. Aoki, H. Kihara, Y. Harada, Ultramicroscopy 38 (1991) 241.
11. [11] R.A. Crowther, R. Henderson, J.M. Smith, J. Struct. Biol. 115 (1996) 9.
12. [12] A.J.C. Wilson, Acta Crystallogr. 2 (1949) 318.
13. [13] A. Rose, J. Soc. Motion Pict. Eng. 47 (1946) 273.
14. [14] W.J. de Ruijter, Micron 26 (1995) 247.