-
1
-
-
0025668776
-
-
A. Ourmazd, F.H. Baumann, M. Bode, Y. Kim, Ultramicroscopy 34 (1990) 237.
-
(1990)
Ultramicroscopy
, vol.34
, pp. 237
-
-
Ourmazd, A.1
Baumann, F.H.2
Bode, M.3
Kim, Y.4
-
2
-
-
0001400412
-
-
P. Schwander, C. Kisielowski, M. Seibt, F.H. Baumann, Y. Kim, A. Ourmazd, Phys. Rev. Lett. 71 (1993) 4150.
-
(1993)
Phys. Rev. Lett.
, vol.71
, pp. 4150
-
-
Schwander, P.1
Kisielowski, C.2
Seibt, M.3
Baumann, F.H.4
Kim, Y.5
Ourmazd, A.6
-
3
-
-
0029075705
-
-
C. Kisielowski, P. Schwander, F.H. Baumann, M. Seibt, Y. Kim, A. Ourmazd, Ultramicroscopy 58 (1995) 131.
-
(1995)
Ultramicroscopy
, vol.58
, pp. 131
-
-
Kisielowski, C.1
Schwander, P.2
Baumann, F.H.3
Seibt, M.4
Kim, Y.5
Ourmazd, A.6
-
4
-
-
0029346258
-
-
F.H. Baumann, M. Gribelyuk, Y. Kim, C. Kisielowski, J.-L. Maurice, W.-D. Rau, J.A. Rentschier, P. Schwander, A. Ourmazd, Phys. Stat. Sol. (a) 150 (1995) 31.
-
(1995)
Phys. Stat. Sol. (A)
, vol.150
, pp. 31
-
-
Baumann, F.H.1
Gribelyuk, M.2
Kim, Y.3
Kisielowski, C.4
Maurice, J.-L.5
Rau, W.-D.6
Rentschier, J.A.7
Schwander, P.8
Ourmazd, A.9
-
7
-
-
0027109796
-
-
F.H. Baumann, M. Bode, Y. Kim, A. Ourmazd, Ultramicroscopy 47 (1992) 167.
-
(1992)
Ultramicroscopy
, vol.47
, pp. 167
-
-
Baumann, F.H.1
Bode, M.2
Kim, Y.3
Ourmazd, A.4
-
8
-
-
0002827996
-
-
W. Krakow, M. O'Keefe (Eds.), The Minerals, Metals and Materials Society, Warrendale, PA
-
D. Van Dyck, J. Danckaert, W. Coene, E. Selderslaghs, D. Brodin, J. Van Landuyt, S. Amelinckx, in: W. Krakow, M. O'Keefe (Eds.), Computer Simulation of Electron Microscope Diffraction and Images, The Minerals, Metals and Materials Society, Warrendale, PA, 1989, p. 107.
-
(1989)
Computer Simulation of Electron Microscope Diffraction and Images
, pp. 107
-
-
Van Dyck, D.1
Danckaert, J.2
Coene, W.3
Selderslaghs, E.4
Brodin, D.5
Van Landuyt, J.6
Amelinckx, S.7
-
10
-
-
0029346919
-
-
P. De Meulenaere, D. Van Dyck, G. Van Tandeloo, J. Van Landuyt, Ultramicroscopy 60 (1995) 171.
-
(1995)
Ultramicroscopy
, vol.60
, pp. 171
-
-
De Meulenaere, P.1
Van Dyck, D.2
Van Tandeloo, G.3
Van Landuyt, J.4
-
11
-
-
0023438834
-
-
W. Coene, D. Van Dyck, J. Van Landuyt, S. Amelinckx, Phil. Mag. B 56 (1987) 415.
-
(1987)
Phil. Mag. B
, vol.56
, pp. 415
-
-
Coene, W.1
Van Dyck, D.2
Van Landuyt, J.3
Amelinckx, S.4
-
12
-
-
0024852155
-
-
A. Ourmazd, D.W. Taylor, M. Bode, Y. Kim, Science 246 (1989) 1571.
-
(1989)
Science
, vol.246
, pp. 1571
-
-
Ourmazd, A.1
Taylor, D.W.2
Bode, M.3
Kim, Y.4
-
14
-
-
58149421595
-
-
Eigen images may be calculated using Principal Component Analysis. See e.g.: H. Hotelling, J. Educational Psychol. 24 (1933) 417 and 498.
-
(1933)
J. Educational Psychol.
, vol.24
, pp. 417
-
-
Hotelling, H.1
-
22
-
-
0343137528
-
-
Thèse de Doctorat de l'Université Paris 6
-
C. Barreteau, Thèse de Doctorat de l'Université Paris 6, 1995.
-
(1995)
-
-
Barreteau, C.1
-
25
-
-
0023162961
-
-
For the simulations, the multislice procedure of EMS is used; see P.A. Stadelmann, Ultramicroscopy 21 (1987) 131. The images are assembled by patching image stripes of different thicknesses. The concentration gradients are introduced directly in the supercells used to make the stripes.
-
(1987)
Ultramicroscopy
, vol.21
, pp. 131
-
-
Stadelmann, P.A.1
|