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Volumn 83, Issue 5, 1998, Pages 2548-2554
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Comparison of two methods for describing the strain profiles in quantum dots
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000993122
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.366631 Document Type: Review |
Times cited : (448)
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References (17)
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