Direct versus iterative structure retrieval for a Cu/Ti misfit dislocation: A comparison of various 1Å HREM technologies

Journal of Microscopy

Volumn 194, Issue 1, 1999, Pages 124-141

  Möbus, Günter ^a,b   Wagner, T ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

HeteroInterfaces; Misfit dislocations; Quantitative HREM; Strain mapping; Structure retrieval

Indexed keywords

ITERATIVE METHODS; MAPPING;

DIGITAL IMAGE; GEOMETRIC PHASE; HETERO-INTERFACES; IMAGE ANALYSIS TECHNIQUES; ITERATIVE STRUCTURES; PHASE MAPS; QUANTITATIVE HREM; SPECIMEN THICKNESS; STRAIN MAPPING; STRUCTURE RETRIEVAL;

DISLOCATIONS (CRYSTALS);

ARTICLE; COMPARATIVE STUDY; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; IMAGING SYSTEM; PRIORITY JOURNAL; STRUCTURE ANALYSIS; TECHNOLOGY;

EID: 0033005846     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00477.x     Document Type: Article

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