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Volumn 107, Issue C, 1999, Pages 121-158

Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images

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Indexed keywords


EID: 77957695467     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(08)70187-3     Document Type: Article
Times cited : (46)

References (53)
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    • ABAQUS 5.5, Hibbitt, Karlsson & Sorenson Inc.
    • ABAQUS 5.5, Hibbitt, Karlsson & Sorenson Inc.
  • 24
    • 77957695054 scopus 로고    scopus 로고
    • McTempas by Total Resolution, Berkeley, CA
    • McTempas by Total Resolution, Berkeley, CA.
  • 26
    • 77957700539 scopus 로고    scopus 로고
    • NCEM Simulation System. The National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, CA
    • NCEM Simulation System. The National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, CA.
  • 32
    • 77957700360 scopus 로고    scopus 로고
    • PATRAN 6.0, MacNeal-Schwendler Corporation.
    • PATRAN 6.0, MacNeal-Schwendler Corporation.
  • 41
    • 0018650401 scopus 로고
    • Digital image processing: The Semper system
    • Semper 6 by Synoptics Ltd., Cambridge, UK.
    • Saxton W.O., Pitt T.J., and Horner M.M. Digital image processing: The Semper system. Ultramicroscopy 4 (1979) 343 Semper 6 by Synoptics Ltd., Cambridge, UK.
    • (1979) Ultramicroscopy , vol.4 , pp. 343
    • Saxton, W.O.1    Pitt, T.J.2    Horner, M.M.3
  • 45
    • 0023162961 scopus 로고
    • A software package for electron diffraction analysis and HREM image simulation in materials science
    • Stadelmann P.A. A software package for electron diffraction analysis and HREM image simulation in materials science. Ultramkroscopy 51 (1987) 131-145
    • (1987) Ultramkroscopy , vol.51 , pp. 131-145
    • Stadelmann, P.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.