SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 85, Issue 3, 2000, Pages 131-139

Distinguishing glide and shuffle types for 60°dislocation in semicoductors by field-emission HREM image processing

(3) Wang, D a Li, F H a Zou, J b

a INSTITUTE OF PHYSICS (China)

b UNIVERSITY OF SYDNEY (Australia)

Author keywords

60 dislocation of glide and shuffle type; High resolution electron microscopy; Image deconvolution

Indexed keywords

ATOMS; COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); IMAGE RECONSTRUCTION; MATHEMATICAL MODELS; SEMICONDUCTING SILICON;

ELECTRON OPTICAL PARAMETERS; IMAGE DECONVOLUTION;

HIGH RESOLUTION ELECTRON MICROSCOPY;

SILICON;

CONTRAST; CRYSTAL; DISLOCATION; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE PROCESSING; MODEL; REVIEW; SEMICONDUCTOR; SIMULATION; TECHNIQUE; THICKNESS;

EID: 0034333322 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(00)00053-X Document Type: Article

Times cited : (19)

References (43)

1
- 0040787244
- (1958) J. Phys. Chem. Solids , vol.5 , pp. 129
- Hornstra, J.¹

2
- 0000593675
- (1987) Rev. Phys. Appl. , vol.22 , pp. 207
- Louchet, F.¹ Thibault-Desseaux, J.²

3
- 0007735002
- J.P. Hirth, J. Lothe, Theory of Dislocation, 2nd Edition, 1982, p. 373.

4
- 0028533260
- (1994) Ultramicroscopy , vol.56 , pp. 1
- Phillipp, F.¹ Hoschen, R.² Osaki, M.³ Mobus, G.⁴ Ruhle, M.⁵

5
- 0019554902
- (1981) Phil. Mag. A , vol.43 , Issue.4 , pp. 945
- Olsen, A.¹ Spence, J.C.H.²

6
- 0029343415
- (1995) Science , vol.269 , pp. 519
- McGibbon, A.J.¹ Pennycook, S.J.² Angelo, J.E.³

7
- 0033045128
- (1999) Ultramicroscopy , vol.78 , pp. 125
- James, E.M.¹ Browning, N.D.²

8
- 0002170585
- (1949) J. Appl. Phys. , vol.20 , pp. 20
- Scherzer, O.¹

9
- 0027109838
- (1992) Ultramicroscopy , vol.47 , pp. 223
- Lichte, H.¹

10
- 0007736607
- P. Schiske, Proceedings of the European Conference On Electron Microscopy, Rome, 1968, p. 145

11
- 0002626756
- (1973) J. Phys. D , vol.6
- Misell, D.L.¹

12
- 0021601720
- (1984) Ultramicroscopy , vol.15 , pp. 151
- Kirkland, E.J.¹

13
- 0022415987
- (1985) Ultramicroscopy , vol.17 , pp. 87
- Kirkland, E.J.¹ Siegel, B.M.² Uyeda, N.³ Fujiyoshi, Y.⁴

14
- 0007731385
- W.O. Saxton, Proceedings of the 11th International Congress on Electron Microscopy, Kyoto, Post-deadline paper, 1986, p. 1.

15
- 0007828539
- D. Van Dyck, M. Op de Beeck, Proceedings of the 12th International Congress on Electron Microscopy, Seattle, Vol. 1, 1990, p. 26.

16
- 0007785416
- W. Coene, G. Janssen, Op de Beeck, D. Van Dyck, Phys. Rev. Lett. 69 (1992) 3743.

17
- 0030221729
- (1996) Ultramicroscopy , vol.64 , pp. 1
- Van Dyck, D.¹ Lichte, H.² Van der Mast, K.D.³

18
- 0030221754
- (1996) Ultramicroscopy , vol.64 , pp. 109
- Coene, W.M.J.¹ Thust, A.² Op de Beeck, M.³ Van Dyck, D.⁴

19
- 0030221730
- (1996) Ultramicroscopy , vol.64 , pp. 167
- Op de Beeck, M.¹ Van Dyck, D.² Coene, W.³

20
- 0030221535
- (1996) Ultramicroscopy , vol.64 , pp. 153
- Op de Beeck, M.¹ Van Dyck, D.²

21
- 0030221538
- (1996) Ultramicroscopy , vol.64 , pp. 265
- Tang, D.¹ Zandbergen, H.W.² Jansen, J.³ Op de Beeck, M.⁴ Van Dyck, D.⁵

22
- 0030221724
- (1996) Ultramicroscopy , vol.64 , pp. 99
- Van Dyck, D.¹ Op de Beeck, M.²

23
- 0030221894
- (1996) Ultramicroscopy , vol.64 , pp. 231
- Zandbergen, H.W.¹ Tang, D.² Jansen, J.³ Cava, R.J.⁴

24
- 0007833423
- N. Uyeda, K. Ishizuka, Proceedings of the 8th International Congress on Electron Microscopy, Vol. 1, 1974, p. 322.

25
- 0003809750
- (1979) Acta Phys. Sinica , vol.28 , pp. 267
- Li, F.H.¹ Fan, H.F.²

26
- 0026170663
- (1991) Ultramicroscopy , vol.35 , pp. 339
- Hu, J.J.¹ Li, F.H.²

27
- 4243683689
- (1986) Acta Crystallogr. A , vol.42 , pp. 353
- Fan, F.S.¹ Fan, H.F.² Li, F.H.³

28
- 0026230392
- (1991) Ultramicroscopy , vol.36 , pp. 361
- Fan, H.F.¹ Xiang, S.B.² Li, F.H.³ Pan, Q.⁴ Uyeda, N.⁵ Fujiyoshi, Y.⁶

29
- 0000758510
- (1985) Acta Crystallogr. A , vol.41 , pp. 163
- Fan, H.F.¹ Zhong, Z.Y.² Zheng, C.D.³ Li, F.H.⁴

30
- 0026717714
- (1992) Ultramicroscopy , vol.41 , pp. 387
- Hu, J.J.¹ Li, F.H.² Fan, H.F.³

31
- 0028448515
- (1994) Ultramicroscopy , vol.54 , pp. 229
- Fu, Z.Q.¹ Huang, D.X.² Li, F.H.³ Li, J.Q.⁴ Zhao, Z.X.⁵ Ceng, T.Z.⁶ Fan, F.H.⁷

32
- 0031457312
- (1997) Ultramicroscopy , vol.70 , pp. 13
- Lu, B.¹ Li, F.H.² Wan, Z.H.³ Fan, H.F.⁴ Mao, Z.Q.⁵

33
- 0032156136
- (1998) Mater. Trans. JIM , vol.39 , pp. 920
- Liu, J.¹ Li, F.H.² Wan, Z.H.³ Fan, H.F.⁴ Wu, X.J.⁵ Tamura, T.⁶ Tanabe, K.⁷

34
- 0032723324
- (1999) Micron , vol.30 , pp. 417
- Jiang, H.¹ Li, F.H.² Mao, Z.Q.³

35
- 0007833968
- F.H. Li, J. Liu, X.J. Wu, IUMRS - 6th Int. Conf. in Asia, Hong Kong, China, 2000. p. a4.16

36
- 0007839124
- H. Jiang, F.H. Li, Proceedings of the Sixth International Beijing Conference and Exhibition on Instrumental Analysis, Beijing, 1999, p. A97.

37
- 0001323597
- (1985) Acta Crystallogr. , vol.41 A , pp. 376
- Li, F.H.¹ Tang, D.²

38
- 0007735005
- W.Z. He, H. Chen, F.H. Li, Proceedings of the Sixth Asia-Pacific Conference on Electron microscopy, Hong Kong, 1996, p. 55.

39
- 0031471759
- (1997) Ultramicroscopy , vol.70 , pp. 1
- He, W.Z.¹ Li, F.H.² Chen, H.³ Kawasaki, K.⁴ Oikawa, T.⁵

40
- 0007731388
- A. Thust, MHF Overwijk, WMJ Coene, M. Lentzen, Ultramicroscopy 64 (1996) 249.

41
- 0007781524
- F.H. Li, Proceedings of International Symposium on Hybrid Analysis for Functional Nanostructure, Kyoto, Japan, 1998, p. 25.

42
- 0034072259
- (2000) J. Electron Microsc. , vol.49 , pp. 17
- Li, F.H.¹ Wang, D.² He, W.Z.³

43
- 0007832364
- Electron Microscopy in Materials Science Academic Press, New York
- (1971)
- Thon, F.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.