IC's radiation effects modeling and estimation

Microelectronics Reliability

Volumn 40, Issue 12, 2000, Pages 1997-2018

  Belyakov, V V ^a   Chumakov, A I ^a   Nikiforov, A Y ^a   Pershenkov, V S ^a   Skorobogatov, P K ^a   Sogoyan, A V ^a  

^a NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; RADIATION EFFECTS; SEMICONDUCTOR DEVICE MODELS;

RADIATION HARDNESS ESTIMATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034559429     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(00)00021-4     Document Type: Article

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