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Volumn , Issue , 1995, Pages 9-18
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Recent advances in understanding total-dose effects in bipolar transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR TRANSISTORS;
DIGITAL CIRCUITS;
ELECTRIC CHARGE;
IONIZATION;
IRRADIATION;
LEAKAGE CURRENTS;
LINEAR INTEGRATED CIRCUITS;
OXIDES;
RADIATION HARDENING;
SEMICONDUCTOR DEVICE MODELS;
TEMPERATURE;
IONIZING RADIATION;
LOW DOSE RATE EFFECTS;
POST IRRADIATION CURRENT GAIN;
SURFACE RECOMBINATION VELOCITY;
TOTAL DOSE EFFECTS;
TRAPPED POSITIVE CHARGE;
RADIATION EFFECTS;
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EID: 0029459927
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (13)
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References (33)
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