Laser simulation adequacy of dose rate latch-up

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 371-375

  Skorobogatov, P K ^a   Nikiforov, A Y ^a   Ahabaev, B A ^a  

^a Specialized Electronic Systems   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DOSIMETRY; IMPURITIES; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; NUMERICAL METHODS; PHOTOCURRENTS; SEMICONDUCTOR DOPING; SUBSTRATES; TWO DIMENSIONAL;

DOSE RATE LATCH UP; LASER SIMULATION; LATCH UP TESTS; THRESHOLD EFFECT;

LASER BEAM EFFECTS;

EID: 0031625476     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)