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Volumn , Issue , 1998, Pages 68-73
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Radiation characterisation of commercially available 1Mbit/4Mbit SRAMs for space applications
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
IONIZATION;
RADIATION DAMAGE;
TESTING;
SINGLE EVENT EFFECTS;
SPACECRAFT EQUIPMENT;
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EID: 0032295571
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (22)
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References (5)
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