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Volumn 43, Issue 6 Pt 1, 1996, Pages 2537-3196
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Proceedings of the 1996 IEEE Nuclear and Space Radiation Effects Conference, NSPEC
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
COSMIC RAYS;
DOSIMETERS;
DOSIMETRY;
INTEGRATED CIRCUITS;
ION IMPLANTATION;
MOSFET DEVICES;
OPTICAL MATERIALS;
RADIATION DETECTORS;
RADIATION HAZARDS;
RADIATION SHIELDING;
SILICON ON INSULATOR TECHNOLOGY;
SILICON ON SAPPHIRE TECHNOLOGY;
ATMOSPHERIC PRESSURE CHEMICAL VAPOR DEPOSITION (APCVD);
CHARGE PUMPING;
DIAMOND DETECTORS;
EIREV;
ELECTRON TRAPPING;
NUCLEAR RADIATION DISPLACEMENT DAMAGE;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION (PECVD);
RADIATION INDUCED INTERFACE TRAPS;
RADIATION TOLERANCE;
SEPARATION BY IMPLANTATION OF IONS (SIMOX);
RADIATION EFFECTS;
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EID: 0030368576
PISSN: 00189499
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (25)
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References (0)
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