Single event latchup threshold estimation based on laser dose rate test results

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2034-2039

  Chumakov, A I ^a   Egorov, A N ^a   Mavritsky, O B ^a   Nikiforov, A Y ^a   Yanenko, A V ^a  

^a Specialized Electronic Systems   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; LASERS;

SINGLE EVENT LATCHUP (SEL);

RADIATION DAMAGE;

EID: 0031358695     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658986     Document Type: Article

References (9)

1. A.H.Johnston, B.W.Hughlock, "Latchup in CMOS from Single Particles", IEEE Trans, on Nuclear Science, Vol. 37, No.6, pp. 1886-1893, Dec. 1990.
2. S.C.Moss, S.D.Lalumondiere, J.R.Scarpulla, K.P. MacWillams, W.R.Crain, R.Koga, "Correlation of Picosecond Laser-Induced Latchup in CMOS Test Structures", IEEE Trans, on Nuclear Science, Vol.42, No.6, pp. 1948-1956, Dec. 1995.
3. RVelazco, T.Calin, M.Nicolaidis, S.C.Moss, S.D. Lalumondiere, R.Koga, "SEU-Hardened Storage Cell Validation Using a Pulsed Laser", IEEE Trans, on Nuclear Science, Vol. 43, No.6, Dec. 1996.
4. G.Bruguier, J-M.Palau, "Single Particle-Induced Latchup", IEEE Trans, on Nuclear Science, Vol.43, No.2, pp. 522-533, Apr. 1996.
5. A.H.Johnston, "The Influence of VLSI Technology Evolution on Radiation-Induced Latchup in Space Systems", IEEE Trans, on Nuclear Science, Vol. 43, No.2, pp. 505-521, Apr. 1996.
6. H, de La Kodierte, G.Bruguier, J.-M.Palau, J.Gasiot, R. Ecoffet, "Trace par simulation des courbes de section efficace de latchup déclenche par ion lourd," Proc. of RADECS-95, September 18-22, 1995, Arcachon, France, pp.359-364.
7. P.Fouillat, H.Lapuyade, ATouboul, J.P.Dom, R. Gaillard, "Numerical Modelling of Mechanisms Involved in latch up Triggering by a Laser Beam", Proc. of RADECS-95, September 18-22, 1995, Arcachon, France, pp.379-386.
8. A,Y.Nikiforov, O.B.Mavritsky, A.N.Egorov, V.S.Figurov, V.A.Telets P.K.Skorobogatov, S.A.Polevitch "RADON-5E" Portable Pulsed Laser Simulator: Description, Qualification Technique and Results, Dosimetry Procedure", IEEE Radiation Effects Workshop Records, 1996, pp.49-54.
9. A.I.Chumakov, D.V.Gromov, O.A.Kalashnikov, A.Y.Nikiforov, A.I.Sheremetyev, P.K.Skorobogatov, V.A.Telets and A.V.Yancnko "Specialized Simulation Test System for Microelectronics Devices Radiation Hardness Investigation and Failure Prediction", Proc. of the Second Workshop on Electronics for LHC Experiments, Balatonfured, Hungary, Sept. 23-27, f996, pp. 428-432.