Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2665-2672

  Pease, Ronald L ^a   Gehlhausen, Mark ^a   Krieg, Jeff ^b   Titus, Jeff ^b   Turflinger, Tom ^c   Emily, Dave ^c   Cohn, Lew ^c  

^a RLP Research   (United States)

^b NAVAL SURFACE WARFARE CENTER   (United States)

^c DEFENSE THREAT REDUCTION AGENCY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; INTEGRATED CIRCUIT TESTING; IRRADIATION; OPERATIONAL AMPLIFIERS; RADIATION EFFECTS; RADIATION HARDENING;

ENHANCED LOW DOSE RATE SENSITIVITY (ELDRS); RADIATION HARDNESS;

LINEAR INTEGRATED CIRCUITS;

EID: 0032313729     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736512     Document Type: Article

References (12)

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