Single-event effects rate prediction

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 483-495

  Pickel, James C ^a  

^a MAXWELL TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DATA STORAGE EQUIPMENT; ELECTRIC FIELD EFFECTS; FORECASTING; INTEGRATED CIRCUITS; IONS; LOGIC CIRCUITS; MATHEMATICAL MODELS; MICROELECTRONICS; PROTONS; RANDOM PROCESSES; SPACE APPLICATIONS;

MODELING PARAMETERS; RATE PREDICTION MODELS; SINGLE EVENT EFFECTS; SINGLE EVENT LATCH UP; SINGLE EVENT UPSET;

RADIATION EFFECTS;

EID: 0030129241     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490895     Document Type: Article

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