Simplified estimation of proton-induced SEU

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 553-556

  Chumakov, A I ^a   Kuznetsov, N V ^a  

^a Specialized Electronic Systems   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CALIFORNIUM; CMOS INTEGRATED CIRCUITS; DOSIMETRY; ESTIMATION; HEAVY IONS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; PROTON IRRADIATION; RANDOM ACCESS STORAGE;

BENDEL MODEL; PROTON ENERGY; PROTON FLUX; PROTON UPSET CROSS SECTION; SINGLE EVENT UPSET;

RADIATION EFFECTS;

EID: 0031640330     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)