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Volumn 30, Issue 5, 1999, Pages 547-552

IC space radiation effects experimental simulation and estimation methods

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEGRADATION; FAILURE (MECHANICAL); FUNCTIONS; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; IONS; IRRADIATION; LASERS; PROTONS; RADIATION BELTS; TEMPERATURE;

EID: 0033208089     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(99)00227-9     Document Type: Article
Times cited : (19)

References (19)
  • 8
    • 0346840948 scopus 로고
    • 2-on-Si structures
    • 2-on-Si structures. J. Appl. Phys. 58:1985;2524-2533.
    • (1985) J. Appl. Phys. , vol.58 , pp. 2524-2533
    • Griscom, D.L.1
  • 11
    • 51649150198 scopus 로고
    • 2 interface states in a hydrogen atmosphere at room temperature
    • 2 interface states in a hydrogen atmosphere at room temperature. J. Electronic Mat. 20:1991;697-704.
    • (1991) J. Electronic Mat. , vol.20 , pp. 697-704
    • Mrstlk, B.J.1
  • 18
    • 0000358816 scopus 로고    scopus 로고
    • Slow and fast state formation caused by hydrogen
    • New York: Plenum Press
    • 2 Interface. 1996;Plenum Press, New York.
    • (1996) 2 Interface
    • Stahlbush, R.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.