Cosmic and terrestrial single-event radiation effects in dynamic random access memories

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 576-593

  Massengill, Lloyd W ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; ERROR CORRECTION; MOS DEVICES; RANDOM ACCESS STORAGE; TECHNOLOGY;

CIRCUIT INFORMATION LOSS; DYNAMIC RANDOM ACCESS MEMORIES; ERROR MITIGATION; SINGLE EVENT EFFECTS; TECHNOLOGICAL DEVELOPMENT;

RADIATION EFFECTS;

EID: 0030130310     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490902     Document Type: Article

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