Heavy ion/proton test results on high integrated memories

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 36-42

  Duzellier, S ^a   Falguere, D ^a   Ecoffet, R ^b  

^a ONERA   (France)

^b CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; FLIGHT SIMULATORS; RADIATION EFFECTS; STATIC RANDOM ACCESS STORAGE;

ANGLE EFFECTS; HEAVY ION UPSETS; IN-FLIGHT DATA; TESTING METHOD; UPSET AND LATCH UP;

HEAVY IONS;

EID: 84962180292     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700566     Document Type: Conference Paper

References (11)

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