Alpha-Particle Tracks in Silicon and their Effect on Dynamic MOS RAM Reliability

IEEE Transactions on Electron Devices

Volumn 26, Issue 1, 1979, Pages 10-16

  Yaney, David S ^a   Nelson, J T ^a   Vanskike, Lowell L ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MIS - RELIABILITY;

DATA STORAGE, SEMICONDUCTOR;

ALPHA RADIATION; COMPUTER ANALYSIS; COMPUTER MEMORY; SEMICONDUCTOR;

EID: 0018330997     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1979.19371     Document Type: Article

References (8)

1. T. C. May and M. H. Woods, in Proc. 1978 Int. Reliability Physics Symp. IEEE Catalog No. 78CH1294-8PHY, pp. 33–40.
2. R. D. Ryan, IEEE Trans. Nucl. Sci., Vol. NS-20, p. 473, 1973.
3. R. D. Evans, “Passage of heavy charged particles through matter,” in The Atomic Nucleus. New York: McGraw-Hill, 1955.
4. C. F. Williamson, J. R. Boujot, and J. Picard, CEA-R-3042 (July 1966). Reprinted in Silicon Surface-Barrier and Ion-Implanted Detectors for Charged Particles, Ortec Incorporated, Oak Ridge, TN, Mar. 1976.
5. W. E. Sin, Isotopic Tracers and Nuclear Radiations. New York:
6. Silicon Surface Barrier Radiation Detectors Instruction Manual, Ortec Incorporated, Oak Ridge, TN.
7. D. K. Schroder and J. Guldberg, Solid State Electron., Vol. 14, p. 1285, 1971.
8. B. J. Baliga and M. S. Adler, IEEE Trans. Electron Devices, Vol. ED-25, p. 472, 1978.