Single event error immune CMOS ram

IEEE Transactions on Nuclear Science

Volumn 29, Issue 6, 1982, Pages 2040-2043

  Andrews, J L ^a   Schroeder, J E ^b   Gingerich, B L ^b   Kolasinski, W A ^c   Koga, R ^c   Diehl, S E ^d  

^a GENERAL ELECTRIC COMPANY   (United States)

^b INTERSIL CORPORATION   (United States)

^c AEROSPACE CORPORATION   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; DATA STORAGE, DIGITAL - RANDOM ACCESS; RADIATION EFFECTS; SATELLITES;

DATA STORAGE, SEMICONDUCTOR;

EID: 0020311020     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4336492     Document Type: Article

References (10)

1. H. A. Kolasinski, J. B. Blake, J. K. Anthony, W. E. Price, and E. C. Smith, “Simulation of Cosmic Ray Induced Soft Errors and Latchup in Integrated-Circuit Memories,” IEEE Trans. on Nuc. Sci., NS-26, pp. 5087-5091, (1979).
2. J. C. Pickel and J. T. Blandford Jr., “CMOS RAM Cosmic Ray - Induced Error Rate Analysis,” IEEE-Trans. on Nucl. Sci., Vol. NS-28, pp. 3962-2967 (1981).
3. L. L. Sivo, J.C. Peden, M. Brettschneider, W. Price and P. Pentecost, “Cosmic Ray-Induced Soft Errors in Statis MOS Memory Cells”, IEEE Trans. on Nucl. Sci., Vol. NS-26, pp. 5042-4057 (1979).
4. J. E. Schroeder, A. Ochoa Jr., and P.V. Dressendorfer, “Latchup Elimination in Bulk CMOS LSI Circuits” IEEE Trans. on Nucl. Sci., Vol. NS-27. pp. 1735-1738, (1980).
5. S. E. Diehl, A. Ochoa Jr., P.V. Dressendorfer, R. Koga, and W.A. Kolasinski, Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMS” IEEE Trans. on Nucl. Sci, (Dec. 1982).
6. W.A. Kolasinski, R. Koga, J.B. Blake and S.E. Diehl, “Soft Error Susceptibility of CMOS RAMS; Dependence Upon Power Supply Voltage”, IEEE Trans. on Nucl. Sci., Vol. NS-28, pp. 4013-4015 (1981).
7. C. Hu, “Alpha - Particle - Induced Field and Enhanced Collection of Carriers” IEEE Electron Device Letters, EDL-3, p.31 (February 1982).
8. L. Kitajewski, “Design of CMOS/SOS Circuits for Space Application,” IEEE Trans. on Nucl. Sci. Vol. NS-28, pp. 3569-3574 (1981).
9. J.C. Pickel “Effect of CMOS Miniaturization on Cosmic-Ray-Induced Error Rate”, Trans. on Nucl. Sci., Vol. NS-29, (Dec 1982).
10. E.A. Peterson, “Calculation of Cosmic Ray-Induced Soft Upsets and Scaling in VLSI Devices”, IEEE Trans. on Nucl. Sci, Vol. NS-29, (Dec 1982).