Single Event Upset in Avionics

IEEE Transactions on Nuclear Science

Volumn 40, Issue 2, 1993, Pages 120-126

  Normand, E ^b  

^a Loral Corp   (United States)

^b BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVIONICS; COSMIC RAYS; NEUTRONS; RADIATION EFFECTS; RADIATION HARDENING;

ERROR DETECTION AND CORRECTION; SINGLE EVENT UPSET; STATIC RANDOM ACCESS MEMORY;

SEMICONDUCTOR STORAGE;

EID: 0027576605     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.212327     Document Type: Article

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