ALPHA-PARTICLE-INDUCED SOURCE-DRAIN PENETRATION (ALPEN) EFFECTS - A NEW SOFT ERROR PHENOMENON.

Conference on Solid State Devices and Materials

Volumn , Issue , 1987, Pages 39-42

  Hisamoto, Digh ^a   Toyabe, Tohru ^a   Takeda, Eiji ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR; INTEGRATED CIRCUITS, VLSI; SEMICONDUCTOR DEVICES, MOSFET;

3-D DEVICE; ALPHA-PARTICLE-INDUCED SOURCE-DRAIN PENETRATION (ALPEN); CHANNEL CURRENT; CHANNEL LENGTH; MEMORIES; SOFT ERROR PHENOMENON;

DATA STORAGE, DIGITAL;

EID: 0023559492     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.7567/ssdm.1987.a-2-4     Document Type: Conference Paper

References (5)