Cosmic Ray Induced Soft Error Rate in VLSI Circuits

IEEE Electron Device Letters

Volumn 4, Issue 6, 1983, Pages 172-174

  Sai Halasz, G A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; DATA STORAGE, DIGITAL - RANDOM ACCESS; MATHEMATICAL STATISTICS - MONTE CARLO METHODS; RADIOACTIVITY;

COSMIC RAYS; PARTICLE-INDUCED SOFT ERROR RATES; RADIOACTIVE CONTAMINATION;

INTEGRATED CIRCUITS, VLSI;

EID: 0020763025     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/EDL.1983.25694     Document Type: Article

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