Calculation of cosmic-ray induced soft upsets and scaling in VLSI devices

IEEE Transactions on Nuclear Science

Volumn 29, Issue 6, 1982, Pages 2055-2063

  Petersen, F L ^a   Shapiro, P ^a   Adams, J H ^a   Burke, E A ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS;

INTEGRATED CIRCUITS, VLSI;

EID: 0020299958     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4336495     Document Type: Article

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