Space radiation evaluation of 16 mbit drams for mass memory applications

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2267-2271

  Calvel, Philippe ^a   Lamothe, Pierre ^a   Barillot, Catherine ^a   Ecoffet, Robert ^b   Duzellier, Sophie ^c   Stassinopoulos, E G ^d  

^a THALES ALENIA SPACE   (France)

^b CNES   (France)

^c CERT/DERTS 3 ^*  (France)

^d NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; IONS; PARTICLE ACCELERATOR ACCESSORIES; PROTONS; RADIATION EFFECTS; SEMICONDUCTOR DEVICE MODELS; SOLAR RADIATION; SPACE APPLICATIONS; SYNCHROTRON RADIATION;

DYNAMIC RANDOM ACCESS MEMORY; HEAVY IONS; SINGLE EVENT EFFECTS;

RANDOM ACCESS STORAGE;

EID: 0028711775     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340574     Document Type: Article

References (7)

1. H.L. Kalter, C.H. Stapper and Al., “A 50-ns 16 Mb DRAM with a 10-ns Data Rate and On-Chip ECC”, IEEE Journal of solid Stae Circuits, Vol.25, n°5, p.1118-1128
2. C.H. Stapper, J.A.Fifield and H.L. Kalter, “High Reliability Fault-Tolerant 16 Mbit Memory Chip”, 1991 Proceedings Annual Reliability and Maintainability Symposium, p.48
3. S.Duzellier, D.Falguère J.Bourrieau and R.Ecoffet, “Heavy ion/proton test results on high integrated memories”, 1993 NSREC Radiation Effects Data Workshop, p.36.
4. R. Ecoffet, M. Labrunee, S. Duzellier and D. Falguère, “Heavy Ion Test Results on Memories”, 1992 NSREC Radiation Effects Data Workshop, P.27.
5. R. Koga, W.R. Crain, K.B. Crawford, D.D. Lau, S.D. Pinkerton, B.K. YI and R. Chitty, “On the suitability of non hardened high density SRAMs for space applications”, IEEE trans. Nucl. Sci., Vol.NS38, N°6, December 1991.
6. R. Harboe Sorensen, R. Muller, E. Daily, B. Nickson, J. Schmitt & F.J. Rombeck, “Radiation Prescreening of 4 Mbit Dynamic Random Access Memories for Space Application”, RADECS 91 Conference Proceeding, Vol.15, p.489.
7. E.L.Petersen, J.C.Pickel, J.H.Adams, Jr and E.C.Smith, “Rate Prediction for Single Event Effects”, IEEE Transactions on Nucl. Sci., Vol. 39, N°.6, pp. 1577–1599, December 1992.