“Charge Collection in Multilayer Structures”

IEEE Transactions on Nuclear Science

Volumn 31, Issue 6, 1984, Pages 1149-1154

  Dressendorfer, P V ^c   Hauser, J ^b   Shapiro, P ^a   Stapor, W J ^a   Wolicki, E A ^a   Petersen, E L ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; SEMICONDUCTING SILICON;

CHARGE COLLECTION; MULTILAYER STRUCTURES; SINGLE-EVENT UPSETS;

INTEGRATED CIRCUITS;

EID: 0021615545     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1984.4333473     Document Type: Article

References (8)

1. A.B. Campbell, A.R. Knudson, P. Shapiro, D.O. Patterson, and L.E. Seiberling, “Charge Collection in Test Structures,”, IEEE Trans. Nucl. Sci., NS-30, p. 4486, December 1983.
2. T.R. Oldham and F.B. McLean, “Charge Collection Measurements for Heavy Ions Incident on n- and p-type Silicon,” IEEE Trans. Nucl. Sci., NS-30, p. 4493, December 1983.
3. M.A. Hopkins and J.R. Srour, “Measurements of Alpha-Particle-Induced Charge in GaAs Devices,” IEEE Trans. Nucl. Sci., NS-30. p. 4457, December 1983.
4. G.C. Messenger, “Collection of Charge on Junction Nodes from Ion Tracks,” IEEE Trans. Nucl. Sci., NS-29, p. 2024, December 1982.
5. C.M. Hsieh, P.C. Murley, and R.R. O’Brien, “A Field-Funneling Effect on the Collection of Alpha-Particle Generated Carriers in Silicon Devices,” IEEE Elect. Dev. Lett., EDL-2, p. 103, April 1981.
6. G.A. Sai-Halasz and M.R. Wordeman, “Monte Carlo Modeling of the Transport of Ionizing Radiation Created Carriers in Integrated Circuits,” IEEE Elect. Dev. Lett., EDL-1, p. 211, October 1980.
7. A.R. Knudson and A.B. Campbell, “Use of an Ion Microbeam to Study Single Event Upsets in Microcircuits,” IEEE Trans. Nucl. Sci., NS-28, p. 4017, December 1981.
8. J.C. Pickel and J.T. Blandford, Jr., “CMOS RAM Cosmic-Ray-Induced- Error-Rate Analysis,” IEEE Trans. Nucl. Sci., NS-28 p. 3962, December 1981.