Characterization of multiple-bit errors from single-ion tracks in integrated circuits

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2267-2274

  Zoutendyk, J A ^a   Edmonds, L D ^a   Smith, L S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; IONS;

ION TRACKS; NODAL JUNCTIONS;

INTEGRATED CIRCUITS;

EID: 0024946277     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45434     Document Type: Article

References (2)

1. J.A. Zoutendyk, H.R. Schwartz, and L.R. Nevill, “Lateral charge transport from heavy-ion tracks in integrated circuits,” IEEE Trans. Nucl. Sci., vol. NS-35, no. 6, pp. 1644–1647, Dec. 1988.
2. F.B. McLean and T.R. Oldham, “Charge funneling in n- and p-type substrates,” IEEE Trans. Nucl. Sci., vol. NS-29, no. 6, pp. 2018–2013, Dec. 1982.