Single Event Mirroring and DRAM Sense Amplifier Designs for Improved Single-Event-Upset Performance

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2026-2034

  Gulati, Kush ^a   Massengill, Lloyd W ^a   Agrawal, Ghasi R ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); BIT ERROR RATE; CAPACITANCE; CELLULAR ARRAYS; CMOS INTEGRATED CIRCUITS; ELECTRIC CHARGE; RADIATION EFFECTS; RADIATION PROTECTION; RESISTORS; TRANSISTORS;

DYNAMIC RANDOM ACCESS MEMORY; RADIATION HARDENING; SINGLE EVENT UPSET;

RANDOM ACCESS STORAGE;

EID: 0028705537     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340538     Document Type: Article

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