The Effect of Cosmic Rays on the Soft Error Rate of a DRAM at Ground Level

IEEE Transactions on Electron Devices

Volumn 41, Issue 4, 1994, Pages 553-557

  O’Gorman, Timothy J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPUTER SIMULATION; COSMIC RAYS; ERRORS; MICROELECTRONICS; MICROPROCESSOR CHIPS; NETWORK COMPONENTS; RADIATION EFFECTS; SENSITIVITY ANALYSIS;

DYNAMIC RANDOM ACCESS MEMORY; SOFT ERROR RATE;

RANDOM ACCESS STORAGE;

EID: 0028419307     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.278509     Document Type: Article

References (19)

1. D. Binder, E. C. Smith, and A. B. Holman, “Satellite anomalies from galactic cosmic rays,” IEEE Trans. Nuclear Sci., vol. NS-22, pp. 2675-2680, Dec. 1975.
2. J. C. Pickel and J. T. Blanford, Jr., “Cosmic ray induced errors in MOS memory cells,” IEEE Trans. Nuclear Sci, vol. NS-25, pp. 1006-1014, Apr. 1978.
3. T. C. May and M. H. Woods, “Alpha-particle-induced soft errors in dynamic memories,” IEEE Trans. Electron Devices, vol. ED-26, pp. 2-9, Jan. 1979.
4. M. R. Wordeman, R. H. Dennard, and G. A. Sai-Halasz, “A buried N-grid for protection against radiation induced charge collection in electronic circuits,” Int. Electron Devices Meet., 1981.
5. D. S. Yaney, J. T. Nelson, and L. L. Vanskike, “Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliability,” IEEE Trans. Electron Devices, vol. ED-26, pp. 10-16, Jan. 1979.
6. C. M. Hsieh, P. C. Murley, and R. R. O’Brien, “Collection of charge from alpha-particle tracks in silicon devices,” IEEE Trans. Electron Devices, vol. ED-30, pp. 686-693, June 1983.
7. S. W. Fu, A. M. Mohsen, and T. C. May, “Alpha-particle-induced charge collection measurements and the effectiveness of a novel p-well protection barrier on VLSI memories,” IEEE Trans. Electron Devices, vol. ED-32, pp. 49-54, Jan. 1985.
8. G. A. Sai-Halasz, “Monte Carlo modeling of the transport of ionizing radiation created carriers in integrated circuits,” IEEE Electron Device Lett., vol. EDL-1, pp. 2111-213, Oct. 1980.
9. R. Silberberg, C. H. Tsao, and J. R. Letaw, “Neutron generated single-event upsets in the atmosphere,” IEEE Trans. Nuclear Sci., vol. NS-31, pp. 1183-1185, Dec. 1984.
10. J. W. Adolphsen, J. J. Yagelowich, K. Sahu, W. A. Kolasinski, R. Koga, E. G. Stassinipoulos, and E. V. Benton, “Space shuttle flight test results of the cosmic ray upset experiment,” IEEE Trans. Nuclear Sci., vol. NS-31, pp. 1178-1182, Dec. 1984.
11. A. Taber and E. Normand, “Single event upsets in avionics,” IEEE Trans. Nuclear Sci., vol. 40, pp. 120-126, Apr. 1993.
12. J. F. Dicello, M. Paciotti, and M. E. Schillaci, “An estimate of error rates in integrated circuits at aircraft altitudes and at sea level,” Nucl. Instr. and Meth., vol. B40/41, pp. 1295-1299, 1989.
13. J. F. Ziegler and W. A. Lanford, “Effect of cosmic rays on computer memories,” Science, vol. 206, pp. 776-788, Nov. 1979.
14. G. A. Sai-Halasz, “Cosmic ray induced soft error rate in VLSI technology,” IEEE Electron Device Lett., vol. EDL-4, June 1983.
15. O. C. Allkofer and P. K. F. Grieder, Cosmic Rays on Earth, Physics Data Nr. 25-1, Fachinformationszentrum Energie, Physik, Mathematik GmbH Karlsruhe, 1984.
16. B. F. Fitzgerald and E. P. Thoma, “A 288K-bit dynamic random access memory,” ISSCC Dig., pp. 64, Feb. 1982.
17. Radiological Health Handbook, U.S. Dept. of Health, Education, and Welfare, pp. 110-113, Jan. 1970.
18. Z. Hasnain and A. Ditali, “Building-in reliability: soft errors—A case study,” Proc. 1992 IRPS, pp. 276-280, 1992.
19. R. Saxena, “Ground level atmospheric neutron flux measurements in the 10-170 MeV range,” Ph.D. dissertation, Univ. New Hampshire, May 1990.