Heavy ion induced single hard errors on submicronic memories

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1693-1697

  Dufour, C ^a   Garnier, P ^a   Carriere T ^a   Beaucour, J ^a   Ecoffet, R ^b   Labrunee M ^b  

^a AIRBUS DEFENCE AND SPACE   (Germany)

^b CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44349168493     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211355     Document Type: Article

References (5)

1. R Koga, WR Crain, KB Crawford, DD Lau, SD Pinkerton and JT Blandford “On the suitability of non hardened high density SRAMs for space applications”, IEEE Trans. on Nucl. Science Vol. 38, n° 6, Dec. 1991.
2. M. Labrunée R. Ecoffet, J. Beaucour, C. Dufour, M. Roméro S. Duzellier.” CECIL Heavy Ion component test coordination” 1st European Conference on Radiation effects on Devices and System. RADECS 1991 p577.
3. C Dufour, P Garnier, J Beaucour, H Delagrange “Heavy Ion testing using the GANIL accelerator and compilation of results with predictions”, 29th NSRE conference; poster W-7, 1992.
4. T.R. Oldham, J.M. Mc Garrity “Ionization of SiO2 by Heavy Charged Particles” IEEE Trans. on Nucl. Science Vol.28, n°6 December 1981 pp 3975
5. T.R. Oldham: private communication.