Cosmic ray induced errors in MOS memory cells

IEEE Transactions on Nuclear Science

Volumn 25, Issue 6, 1978, Pages 1166-1171

  Pickel, J C ^a   Blandford, J T ^a  

^a Rockwell International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMUNICATION SATELLITES; COSMIC RAYS; SEMICONDUCTOR DEVICES, MIS;

MOS RAM; RANDOM-ACCESS MEMORIES;

DATA STORAGE, SEMICONDUCTOR;

EID: 0018157170     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1978.4329508     Document Type: Article

References (10)

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3. C. H. Sie, R. A. Youngblood, J. H. Liao and A. Turk, 15th Annual Proceedings Reliability Physics, Las Vegas, Nevada, April 1977, pp. 27–32.
4. NASA SP-8118, “Interplanetary Charged Particle Models (1974),” March 1975, Section 3.2.
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10. W. Heinrich, Radiation Effects, 1977, 34, pp. 143–148.