Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

Progress in Solid State Chemistry

Volumn 42, Issue 1-2, 2014, Pages 1-21

  Suga, Mitsuo ^a   Asahina, Shunsuke ^a   Sakuda, Yusuke ^a   Kazumori, Hiroyoshi ^a   Nishiyama, Hidetoshi ^a   Nokuo, Takeshi ^a   Alfredsson, Viveka ^b   Kjellman, Tomas ^b   Stevens, Sam M ^c   Cho, Hae Sung ^d   Cho, Minhyung ^d   Han, Lu ^e   Che, Shunai ^e   Anderson, Michael W ^f   Schüth, Ferdi ^g   Deng, Hexiang ^h   Yaghi, Omar M ⁱ   Liu, Zheng ^j   Jeong, Hu Young ^k   Stein, Andreas ^l   Sakamoto, Kazuyuki ^m   Ryoo, Ryong ^d,n   Terasaki, Osamu ^d,o   more..

^a JEOL LTD   (Japan)

^b LUND UNIVERSITY   (Sweden)

^c Private Contributor   (United Kingdom)

^d Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^e SHANGHAI JIAO TONG UNIVERSITY   (China)

^f UNIVERSITY OF MANCHESTER   (United Kingdom)

^g MAX PLANCK INSTITUT FÜR KOHLENFORSCHUNG   (Germany)

^h WUHAN UNIVERSITY   (China)

ⁱ UNIVERSITY OF CALIFORNIA   (United States)

^j NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^k Ulsan National Institute of Science and Technology   (South Korea)

^l University of Minnesota   (United States)

^m CHIBA UNIVERSITY   (Japan)

ⁿ IBS   (South Korea)

^o STOCKHOLM UNIVERSITY   (Sweden)

more..

Author keywords

Atmospheric SEM; Mesoporous materials; Metal organic frameworks; Nano materials; Scanning electron microscopy; Through the lens detection system

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRONS; MESOPOROUS MATERIALS; NANOTECHNOLOGY; ORGANOMETALLICS; SILICA; X RAY POWDER DIFFRACTION; ZEOLITES;

DETECTION SYSTEM; HIERARCHICALLY POROUS MATERIALS; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; METAL ORGANIC FRAMEWORK; METALORGANIC FRAMEWORKS (MOFS); MICROSCOPIC METHODS; POTENTIAL BARRIERS; STRUCTURAL DETAILS;

SCANNING ELECTRON MICROSCOPY;

EID: 84898043548     PISSN: 00796786     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.progsolidstchem.2014.02.001     Document Type: Review

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