A new detection system for x-ray microanalysis based on a silicon drift detector with Peltier cooling

Review of Scientific Instruments

Volumn 68, Issue 6, 1997, Pages 2461-2465

  Fiorini, C ^a   Kemmer, J ^b   Lechner, P ^b   Kromer, K ^c   Rohde, M ^c   Schulein T ^c  

^a POLITECNICO DI MILANO   (Italy)

^b KETEK GMBH   (Germany)

^c RONTEC GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000278148     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148169     Document Type: Article

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