A review of fine structures of nanoporous materials as evidenced by microscopic methods

Journal of Electron Microscopy

Volumn 62, Issue 1, 2013, Pages 109-146

  Liu, Zheng ^a   Fujita, Nobuhisa ^b   Miyasaka, Keiichi ^c   Han, Lu ^d   Stevens, Sam M ^j   Suga, Mitsuo ^e   Asahina, Shunsuke ^b,e   Slater, Ben ^f   Xiao, Changhong ^g   Sakamoto, Yasuhiro ^h   Anderson, Michael W ⁱ   Ryoo, Ryong ^c   Terasaki, Osamu ^c,g  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^d SHANGHAI JIAO TONG UNIVERSITY   (China)

^e JEOL LTD   (Japan)

^f UNIVERSITY COLLEGE LONDON   (United Kingdom)

^g STOCKHOLM UNIVERSITY   (Sweden)

^h Osaka Prefecture University   (Japan)

ⁱ UNIVERSITY OF MANCHESTER   (United Kingdom)

^j NONE

more..

Author keywords

AFM; Electron microscopy; MOF; Silica mesoporous crystal; Structure modulation; Zeolite

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; ELECTRONS; MESOPOROUS MATERIALS; NANOPORES; ORGANOMETALLICS; SCANNING ELECTRON MICROSCOPY; SURFACE DEFECTS; ZEOLITES;

AFM; AVERAGE STRUCTURE; FINE STRUCTURES; MESOPOROUS CRYSTALS; MICROSCOPIC METHODS; MICROSCOPY TECHNIQUE; NANOPOROUS CRYSTALS; NANOPOROUS MATERIALS; SILICUM MESOPOROUS CRYSTAL; STRUCTURE MODULATION;

SILICA;

EID: 84876961584     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfs098     Document Type: Review

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