Electron diffraction based techniques in scanning electron microscopy of bulk materials

Micron

Volumn 28, Issue 4, 1997, Pages 279-308

  Wilkinson, Angus J ^a   Hirsch, Peter B ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Electron backscatter diffraction; Electron channelling; Scanning electron microscopy

Indexed keywords

EID: 0030775904     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(97)00032-2     Document Type: Article

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