Application of low-voltage scanning electron microscopy to the characterization of steel surface

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan

Volumn 93, Issue 2, 2007, Pages 169-175

  Sato, Kaoru ^a   Nagoshi, Masayasu ^a   Kawano, Takashi ^a  

^a JFE STEEL CORPORATION   (Japan)

Author keywords

Backscattered electron image; Complex inclusion; Low voltage scanning electron microscopy; Secondary electron image; Surface oxide; Working distance

Indexed keywords

BACKSCATTERED ELECTRON IMAGE; COMPLEX INCLUSION; LOW VOLTAGE SCANNING ELECTRON MICROSCOPY; SECONDARY ELECTRON IMAGE; SURFACE OXIDE; WORKING DISTANCE;

BACKSCATTERING; COMPLEXATION; ELECTRIC POTENTIAL; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE ANALYSIS;

STEEL SHEET;

EID: 34247275165     PISSN: 00211575     EISSN: None     Source Type: Journal    
DOI: 10.2355/tetsutohagane.93.169     Document Type: Article

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