Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes - An introduction of valence electron spectroscopy for transmission electron microscopy

Journal of Electron Microscopy

Volumn 59, Issue 4, 2010, Pages 251-261

  Terauchi, Masami ^a   Koike, Masato ^b   Fukushima, Kurio ^c   Kimura, Atsushi ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c JEOL LTD   (Japan)

Author keywords

anisotropic soft X ray emission; chemical shift; soft X ray emission spectroscopy; transmission electron microscope; valence band; wavelength dispersive spectroscopy

Indexed keywords

ANISOTROPY; CHEMICAL BONDS; CRYSTALLINE MATERIALS; DISPERSION (WAVES); ELECTRONIC STATES; ELECTRONS; EMISSION SPECTROSCOPY; II-VI SEMICONDUCTORS; PLATINUM; SILICON COMPOUNDS; X RAY SCATTERING; X RAY SPECTROMETERS; ZINC SULFIDE;

ANISOTROPIC SOFT X-RAY EMISSION; EMISSION SPECTRUMS; HIGH DISPERSION; SOFT X RAY EMISSION SPECTROSCOPY; SOFT X-RAY; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE; VALENCE ELECTRON; WAVELENGTH DISPERSIVE; X-RAY EMISSION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955537746     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfq010     Document Type: Article

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