The new X-ray mapping: X-ray spectrum imaging above 100 kHz output count rate with the silicon drift detector

Microscopy and Microanalysis

Volumn 12, Issue 1, 2006, Pages 26-35

  Newbury, Dale E ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Electron beam microanalysis; Energy dispersive X ray spectrometry; Microstructural characterization; Particle analysis; Scanning electron microscopy; Silicon drift detector

Indexed keywords

INORGANIC COMPOUND; SILICON;

ARTICLE; ELECTRON PROBE MICROANALYSIS; IMAGE QUALITY; SCANNING ELECTRON MICROSCOPY; X RAY;

ELECTRON PROBE MICROANALYSIS; INORGANIC CHEMICALS; MICROSCOPY, ELECTRON, SCANNING; RADIOGRAPHIC IMAGE ENHANCEMENT; SILICON; X-RAYS;

EID: 33644850860     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606020X     Document Type: Article

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