Electron channeling contrast imaging of dislocation structures in deformed stoichiometric NiA1

Materials Science and Engineering: A

Volumn 239-240, Issue 1-2, 1997, Pages 150-156

  Ng, B C ^a   Simkin, B A ^a   Crimp, M A ^a  

^a Michigan State University   (United States)

Author keywords

Crack paths; Dislocation structures; High purity NiA1

Indexed keywords

CRACK PROPAGATION; DISLOCATIONS (CRYSTALS); IMAGING TECHNIQUES; SINGLE CRYSTALS; TOUGHENING;

ELECTRON CHANNELING CONTRAST IMAGING TECHNIQUE; NICKEL ALUMINIDE;

NICKEL ALLOYS;

EID: 0013141720     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(97)00574-1     Document Type: Article

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