Analytical/experimental hybrid approach based on spectral power distribution for quantitative degradation analysis of phosphor converted LED

IEEE Transactions on Device and Materials Reliability

Volumn 14, Issue 1, 2014, Pages 365-374

  Song, Bong Min ^a   Han, Bongtae ^b,c  

^a SAMSUNG Electronics   (South Korea)

^b UNIVERSITY OF MARYLAND   (United States)

^c Sungkyunkwan University   (South Korea)

Author keywords

chip degradation; Deconvolution; lens degradation; pc LED; Phosphor converted light emitting diode; phosphor degradation; SPD; spectral power distribution

Indexed keywords

DECONVOLUTION; DEGRADATION; LIGHT EMISSION; LIGHT EMITTING DIODES; MATHEMATICAL MODELS; PACKAGING MATERIALS;

DEGRADATION MECHANISM; DEGRADATION PARAMETER; MATERIAL DEGRADATION; PC-LED; PHOSPHOR DEGRADATION; PHOSPHOR-CONVERTED LEDS; SPD; SPECTRAL POWER DISTRIBUTION;

PHOSPHORS;

EID: 84891663396     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2013.2269478     Document Type: Article

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