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Volumn 11, Issue 3, 2011, Pages 407-416

Physics-of-failure-based prognostics and health management for high-power white light-emitting diode lighting

Author keywords

Light emitting diode (LED) lighting; physics of failure; prognostics and health management (PHM)

Indexed keywords

CYCLE LOADING; DAMAGE MODEL; DESIGN PROCESS; EFFECTS ANALYSIS; FAILURE MECHANISM; HIGH-POWER; LED LIGHTING; LIGHT-EMITTING DIODE (LED) LIGHTING; MARKET DEMAND; PHYSICS-OF-FAILURE; PROGNOSTICS AND HEALTH MANAGEMENTS; WHITE LED; WHITE LIGHT EMITTING DIODES;

EID: 80052623509     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2011.2157695     Document Type: Article
Times cited : (110)

References (40)
  • 1
    • 19744374735 scopus 로고    scopus 로고
    • Solid-state light sources getting smart
    • DOI 10.1126/science.1108712
    • E. F. Schubert and J. K. Kim, "Solid-state light sources getting smart," Science, vol. 308, no. 5726, pp. 1274-1278, May 2005. (Pubitemid 40746117)
    • (2005) Science , vol.308 , Issue.5726 , pp. 1274-1278
    • Schubert, E.F.1    Kim, J.K.2
  • 2
    • 76849109288 scopus 로고    scopus 로고
    • A prognostics and health management roadmap for information and electronics-rich systems
    • Mar
    • M. Pecht and R. Jaai, "A prognostics and health management roadmap for information and electronics-rich systems," Microelectron. Reliab., vol. 50, no. 3, pp. 317-323, Mar. 2010.
    • (2010) Microelectron. Reliab. , vol.50 , Issue.3 , pp. 317-323
    • Pecht, M.1    Jaai, R.2
  • 3
    • 85029657972 scopus 로고    scopus 로고
    • Prognostics and health management of electronics
    • Hoboken, NJ: Wiley ch. 150
    • M. Pecht, "Prognostics and health management of electronics," in Encyclopedia of Structural Health Monitoring. Hoboken, NJ: Wiley, 2009, ch. 150.
    • (2009) Encyclopedia of Structural Health Monitoring
    • Pecht, M.1
  • 5
    • 67650709427 scopus 로고    scopus 로고
    • Physics-of-failure-based prognostics for electronic products
    • M. Pecht and J. Gu, "Physics-of-failure-based prognostics for electronic products," Trans. Inst. Meas. Control, vol. 31, no. 3/4, pp. 309-322, 2009.
    • (2009) Trans. Inst. Meas. Control , vol.31 , Issue.3-4 , pp. 309-322
    • Pecht, M.1    Gu, J.2
  • 7
    • 33846576199 scopus 로고    scopus 로고
    • Mechanism and thermal effect of delamination in light-emitting diode packages
    • Feb
    • J. Z. Hu, "Mechanism and thermal effect of delamination in light-emitting diode packages," Microelectron. J., vol. 38, no. 2, pp. 157-163, Feb. 2007.
    • (2007) Microelectron. J. , vol.38 , Issue.2 , pp. 157-163
    • Hu, J.Z.1
  • 8
    • 70350341510 scopus 로고    scopus 로고
    • Effects of defects on the thermal and optical performance of high-brightness light-emitting diodes
    • Oct
    • L. X. Tan, J. Li, and K. Wang, "Effects of defects on the thermal and optical performance of high-brightness light-emitting diodes," IEEE Trans. Electron. Packag. Manuf., vol. 32, no. 4, pp. 233-240, Oct. 2009.
    • (2009) IEEE Trans. Electron. Packag. Manuf. , vol.32 , Issue.4 , pp. 233-240
    • Tan, L.X.1    Li, J.2    Wang, K.3
  • 9
    • 57549117854 scopus 로고    scopus 로고
    • Thermal and mechanical analysis of high-power LEDs with ceramic packages
    • Jun
    • J. Z. Hu, L. Q. Yang, and M. W. Shin, "Thermal and mechanical analysis of high-power LEDs with ceramic packages," IEEE Trans. Device Mater. Rel., vol. 8, no. 2, pp. 297-303, Jun. 2008.
    • (2008) IEEE Trans. Device Mater. Rel. , vol.8 , Issue.2 , pp. 297-303
    • Hu, J.Z.1    Yang, L.Q.2    Shin, M.W.3
  • 10
    • 78651069924 scopus 로고    scopus 로고
    • Hierarchical life prediction model for actively hierarchical life prediction model for actively
    • Dec
    • B.-M. Song, "Hierarchical life prediction model for actively hierarchical life prediction model for actively," IEEE Trans. Compon. Packag. Technol., vol. 33, no. 4, pp. 728-737, Dec. 2010.
    • (2010) IEEE Trans. Compon. Packag. Technol. , vol.33 , Issue.4 , pp. 728-737
    • Song, B.-M.1
  • 13
    • 78249259333 scopus 로고    scopus 로고
    • Recent results on the degradation of white LEDs for lighting
    • Sep (11pp)
    • G. Meneghesso, M. Meneghini, and E. Zanoni, "Recent results on the degradation of white LEDs for lighting," J. Phys. D, Appl. Phys., vol. 43, no. 35, p. 354 007, Sep. 2010, (11pp).
    • (2010) J. Phys. D, Appl. Phys. , vol.43 , Issue.35 , pp. 354-007
    • Meneghesso, G.1    Meneghini, M.2    Zanoni, E.3
  • 14
    • 73349105248 scopus 로고    scopus 로고
    • A review on the physical mechanisms that limit the reliability of GaN-based LEDs
    • Jan
    • M. Meneghini, A. Tazzoli, and G. Mura, "A review on the physical mechanisms that limit the reliability of GaN-based LEDs," IEEE Trans. Electron Devices, vol. 57, no. 1, pp. 108-118, Jan. 2010.
    • (2010) IEEE Trans. Electron Devices , vol.57 , Issue.1 , pp. 108-118
    • Meneghini, M.1    Tazzoli, A.2    Mura, G.3
  • 15
    • 27744468281 scopus 로고    scopus 로고
    • Life of LED-based white light sources
    • Sep
    • N. Narendran and Y. M. Gu, "Life of LED-based white light sources," J. Display Technol., vol. 1, no. 1, pp. 167-171, Sep. 2005.
    • (2005) J. Display Technol. , vol.1 , Issue.1 , pp. 167-171
    • Narendran, N.1    Gu, Y.M.2
  • 16
    • 77955716771 scopus 로고    scopus 로고
    • Failure and degradation mechanisms of high-power white light emitting diodes
    • Jul
    • S. C. Yang, P. Lin, and C. P. Wang, "Failure and degradation mechanisms of high-power white light emitting diodes," Microelectron. Reliab., vol. 50, no. 7, pp. 959-964, Jul. 2010.
    • (2010) Microelectron. Reliab. , vol.50 , Issue.7 , pp. 959-964
    • Yang, S.C.1    Lin, P.2    Wang, C.P.3
  • 17
    • 0031163481 scopus 로고    scopus 로고
    • Kinetic model for degradation of light-emitting diodes
    • Jun
    • S. L. Chuang, "Kinetic model for degradation of light-emitting diodes," IEEE J. Quantum Electron., vol. 33, no. 6, pp. 970-978, Jun. 1997.
    • (1997) IEEE J. Quantum Electron. , vol.33 , Issue.6 , pp. 970-978
    • Chuang, S.L.1
  • 18
    • 43049105414 scopus 로고    scopus 로고
    • Electrical, optical and thermal degradation of high power GaN/InGaN light-emitting diodes
    • Feb
    • J. Z. Hu, "Electrical, optical and thermal degradation of high power GaN/InGaN light-emitting diodes," J. Phys. D, Appl. Phys., vol. 41, no. 3, p. 035 107, Feb. 2008.
    • (2008) J. Phys. D, Appl. Phys. , vol.41 , Issue.3 , pp. 035-107
    • Hu, J.Z.1
  • 19
    • 18844413231 scopus 로고    scopus 로고
    • Study of degradation mechanism of blue light emitting diodes
    • DOI 10.1016/j.tsf.2005.01.018, PII S0040609005000192
    • A. Uddin, A. C. Wei, and T. G. Andersson, "Study of degradation mechanism of blue light emitting diodes," Thin Solid Films, vol. 483, no. 1/2, pp. 378-381, Jul. 2005. (Pubitemid 40683901)
    • (2005) Thin Solid Films , vol.483 , Issue.1-2 , pp. 378-381
    • Uddin, A.1    Wei, A.C.2    Andersson, T.G.3
  • 20
    • 0242335115 scopus 로고    scopus 로고
    • Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses
    • Dec
    • X. A. Cao, P. M. Sandvik, and S. F. LeBoeuf, "Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses," Microelectron. Reliab., vol. 43, no. 12, pp. 1987-1991, Dec. 2003.
    • (2003) Microelectron. Reliab. , vol.43 , Issue.12 , pp. 1987-1991
    • Cao, X.A.1    Sandvik, P.M.2    Leboeuf, S.F.3
  • 21
    • 69249209730 scopus 로고    scopus 로고
    • Evaluation of AlGaInP LEDs reliability based on accelerated tests
    • Sep.-Nov
    • E. Nogueira, "Evaluation of AlGaInP LEDs reliability based on accelerated tests," Microelectron. Reliab., vol. 49, no. 9-11, pp. 1240-1243, Sep.-Nov. 2009.
    • (2009) Microelectron. Reliab. , vol.49 , Issue.9-11 , pp. 1240-1243
    • Nogueira, E.1
  • 22
    • 73449092882 scopus 로고    scopus 로고
    • Effects of Mg dopant on the degradation of InGaN multiple quantum wells in AlInGaN-based light emitting devices
    • Oct
    • S. N. Lee, "Effects of Mg dopant on the degradation of InGaN multiple quantum wells in AlInGaN-based light emitting devices," J. Electro-ceram., vol. 23, no. 2-4, pp. 406-409, Oct. 2009.
    • (2009) J. Electro-ceram. , vol.23 , Issue.2-4 , pp. 406-409
    • Lee, S.N.1
  • 24
    • 55549141160 scopus 로고    scopus 로고
    • Thermal effects in packaging high power light emitting diode arrays
    • Feb
    • A. Christensen and S. Graham, "Thermal effects in packaging high power light emitting diode arrays," Appl. Therm. Eng., vol. 29, no. 2/3, pp. 364-371, Feb. 2009.
    • (2009) Appl. Therm. Eng. , vol.29 , Issue.2-3 , pp. 364-371
    • Christensen, A.1    Graham, S.2
  • 26
    • 80052644640 scopus 로고    scopus 로고
    • Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses
    • Sep.-Nov
    • R. Baillot, "Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses," Microelectron. Reliab., vol. 50, no. 9-11, pp. 1568-1573, Sep.-Nov. 2010.
    • (2010) Microelectron. Reliab. , vol.50 , Issue.9-11 , pp. 1568-1573
    • Baillot, R.1
  • 27
    • 63049115303 scopus 로고    scopus 로고
    • A review on the reliability of GaN-based LEDs
    • Jun
    • M. Meneghini, "A review on the reliability of GaN-based LEDs," IEEE Trans. Device Mater. Rel., vol. 8, no. 2, pp. 323-331, Jun. 2008.
    • (2008) IEEE Trans. Device Mater. Rel. , vol.8 , Issue.2 , pp. 323-331
    • Meneghini, M.1
  • 28
    • 39749085948 scopus 로고    scopus 로고
    • Failure mechanisms associated with lens shape of high-power LED modules in aging test
    • Feb
    • Y. C. Hsu, Y. K. Lin, and M. H. Chen, "Failure mechanisms associated with lens shape of high-power LED modules in aging test," IEEE Trans. Electron Devices, vol. 55, no. 2, pp. 689-693, Feb. 2008.
    • (2008) IEEE Trans. Electron Devices , vol.55 , Issue.2 , pp. 689-693
    • Hsu, Y.C.1    Lin, Y.K.2    Chen, M.H.3
  • 29
    • 57149141407 scopus 로고    scopus 로고
    • Study of phosphor thermal-isolated packaging technologies for high-power white light-emitting diodes
    • Aug. 1
    • N. F. Fan, H. Wu, and Y. Zhao, "Study of phosphor thermal-isolated packaging technologies for high-power white light-emitting diodes," IEEE Trans. Electron Devices, vol. 19, no. 15, pp. 1121-1123, Aug. 1, 2007.
    • (2007) IEEE Trans. Electron Devices , vol.19 , Issue.15 , pp. 1121-1123
    • Fan, N.F.1    Wu, H.2    Zhao, Y.3
  • 30
    • 77956754854 scopus 로고    scopus 로고
    • Phosphors for LED-based solid-state lighting
    • A. A. Setlur, "Phosphors for LED-based solid-state lighting," Electro-chem. Soc. Interface, vol. 18, no. 4, pp. 32-36, 2009.
    • (2009) Electro-chem. Soc. Interface , vol.18 , Issue.4 , pp. 32-36
    • Setlur, A.A.1
  • 31
    • 21344442442 scopus 로고    scopus 로고
    • Analysis of high-power packages for phosphor-based white-light-emitting diodes
    • Jun
    • H. Luo and J. K. Kim, "Analysis of high-power packages for phosphor-based white-light-emitting diodes," Appl. Phys. Lett., vol. 86, no. 24, pp. 243 505-1-243 505-3, Jun. 2005.
    • (2005) Appl. Phys. Lett. , vol.86 , Issue.24 , pp. 2435051-2435053
    • Luo, H.1    Kim, J.K.2
  • 32
    • 0033904050 scopus 로고    scopus 로고
    • Solder joint fatigue models: Review and applicability to chip scale packages
    • W. W. Lee, L. T. Nguyena, and G. S. Selvaduray, "Solder joint fatigue models: Review and applicability to chip scale packages," Microelectron. Reliab., vol. 40, no. 2, pp. 231-244, Feb. 2000. (Pubitemid 30557348)
    • (2000) Microelectronics Reliability , vol.40 , Issue.2 , pp. 231-244
    • Lee, W.W.1    Nguyen, L.T.2    Selvaduray, G.S.3
  • 34
    • 34548151549 scopus 로고    scopus 로고
    • A microjet array cooling system for thermal management of high-brightness LEDs
    • DOI 10.1109/TADVP.2007.898522, Special Section on Wafer-Level Packaging
    • X. B. Luo and S. Liu, "A microjet array cooling system for thermal management of high-brightness LEDs," IEEE Trans. Adv. Packag., vol. 30, no. 3, pp. 475-484, Aug. 2007. (Pubitemid 47308005)
    • (2007) IEEE Transactions on Advanced Packaging , vol.30 , Issue.3 , pp. 475-484
    • Luo, X.1    Liu, S.2
  • 38
    • 75449105472 scopus 로고    scopus 로고
    • Status and prospects for phosphor-based white LED packaging
    • Z. Y. Liu, S. Liu, and K. Wang, "Status and prospects for phosphor-based white LED packaging," Front. Optoelectron. China, vol. 2, no. 2, pp. 119-140, 2009.
    • (2009) Front. Optoelectron. China , vol.2 , Issue.2 , pp. 119-140
    • Liu, Z.Y.1    Liu, S.2    Wang, K.3
  • 40
    • 80052640788 scopus 로고    scopus 로고
    • DR-03: LM-80 Test Report May 28
    • Philips, DR-03: LM-80 Test Report, p. 51010, May 28.
    • Philips , pp. 51010


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.