Lifetime estimation of high-power white LED using degradation-data-driven method

IEEE Transactions on Device and Materials Reliability

Volumn 12, Issue 2, 2012, Pages 470-477

  Fan, Jiajie ^a   Yung, Kam Chuen ^a   Pecht, Michael ^b,c  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

Degradation data driven method (DDDM); high power white light emitting diode (HPWLED); lifetime estimation; reliability

Indexed keywords

ACCELERATED LIFE TESTS; ACCURATE PREDICTION; ANALYTICAL METHOD; APPROXIMATION METHODS; CONFIDENCE INTERVAL; DEGRADATION-DATA-DRIVEN METHOD (DDDM); HIGH-POWER; LIFE-TESTS; LIFETIME ESTIMATION; LIGHTING MARKET; LUMEN MAINTENANCE; MEAN TIME TO FAILURE; PATH MODELS; PREDICTION ACCURACY; RELIABILITY ASSESSMENTS; RELIABILITY FUNCTIONS; RELIABILITY INFORMATION; RELIABLE ELECTRONICS; TEST STANDARDS; TWO-STAGE METHODS; WHITE LED; WHITE LIGHT EMITTING DIODES;

APPROXIMATION THEORY; DEGRADATION; ESTIMATION; MAINTENANCE; RELIABILITY; RELIABILITY ANALYSIS;

LIGHT EMITTING DIODES;

EID: 84862007947     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2012.2190415     Document Type: Article

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