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Journal of the Electrochemical Society

Volumn 158, Issue 2, 2011, Pages

Optical degradation of phosphor-converted white gan-based light-emitting diodes under electro-thermal stress

(4) Jung, Eunjin a Ryu, Jae Hyoung a Hong, Chang Hee a Kim, Hyunsoo a

a Chonbuk National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT TEMPERATURES; COLOR TEMPERATURES; ELECTRO-THERMAL STRESS; ELECTROLUMINESCENCE SPECTRA; GAN-BASED LIGHT-EMITTING DIODES; INJECTED CURRENT; LUMINOUS FLUX; NON-RADIATIVE RECOMBINATIONS; OPTICAL DEGRADATION; OPTICAL OUTPUT; RADIANT FLUX; STRESS TIME; THERMAL PROPERTIES;

ELECTRIC PROPERTIES; GALLIUM ALLOYS; GALLIUM NITRIDE; LIGHT; LIGHT EMISSION; LIGHT EMITTING DIODES; LUMINOUS MATERIALS; OPTICAL MICROSCOPY; ORGANIC LIGHT EMITTING DIODES (OLED); PHOSPHORS; PHOTODEGRADATION; THERMAL STRESS; THERMODYNAMIC PROPERTIES; THERMOELASTICITY;

OPTICAL PROPERTIES;

EID: 78650734420 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3524285 Document Type: Article

Times cited : (24)

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