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Volumn 50, Issue 7, 2010, Pages 959-964

Failure and degradation mechanisms of high-power white light emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

AGING TESTS; BULK DEFECTS; DEGRADATION MECHANISM; DEGRADATION RATE; ELECTRIC STRESS; ELECTRICAL CURRENT; HIGH-POWER; JUNCTION TEMPERATURES; LED CHIPS; LIGHT-EXTRACTION EFFICIENCY; LONG TERM PERFORMANCE; LUMINOUS FLUX; PACKAGE MATERIALS; THERMAL CONTRIBUTIONS; WHITE LIGHT EMITTING DIODES;

EID: 77955716771     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.03.007     Document Type: Conference Paper
Times cited : (109)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.